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UA78L05AIDRE4 Datasheet(PDF) 1 Page - Texas Instruments |
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UA78L05AIDRE4 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 20 page PK PACKAGE (TOP VIEW) INPUT COMMON OUTPUT LP PACKAGE (TO-92, TO-226AA) (TOP VIEW) INPUT COMMON OUTPUT D PACKAGE (TOP VIEW) 1 2 3 4 8 7 6 5 OUTPUT COMMON COMMON NC INPUT COMMON COMMON NC NC – No internal connection μA78L00 www.ti.com SLVS010U – JANUARY 1976 – REVISED MAY 2011 μA78L00 Series Positive-Voltage Regulators Check for Samples: μA78L00 1 FEATURES DESCRIPTION This series of fixed-voltage integrated-circuit voltage • 3-Terminal Regulators regulators is designed for a wide range of • Output Current up to 100 mA applications. These applications include on-card • No External Components regulation for elimination of noise and distribution problems associated with single-point regulation. In • Internal Thermal-Overload Protection addition, they can be used with power-pass elements • Internal Short-Circuit Current Limiting to make high-current voltage regulators. One of these regulators can deliver up to 100 mA of output current. The internal limiting and thermal-shutdown features of these regulators essentially make them immune to overload. When used as a replacement for a Zener diode-resistor combination, an effective improvement in output impedance can be obtained, together with lower bias current. The μA78L00C and μA78L00AC series devices are characterized for operation over the virtual junction temperature range of 0°C to 125°C. The μA78L05AI device is characterized for operation over the virtual junction temperature range of −40°C to 125°C. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 1976–2011, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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