ACS780 datasheet(11/24 Pages) ALLEGRO

No. de pieza	ACS780

Descripción Electrónicos	High-Precision Linear Hall-Effect-Based Current Sensor IC With 200 關廓 Current Conductor

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Fabricante Electrónico	ALLEGRO [Allegro MicroSystems]

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High-Precision Linear Hall-Effect-Based

Current Sensor IC With 200 µΩ Current Conductor

ACS780xLR

11

Allegro MicroSystems, LLC

115 Northeast Cutoff

Worcester, Massachusetts 01615-0036 U.S.A.

1.508.853.5000; www.allegromicro.com

X150U PERFORMANCE CHARACTERISTICS1: TOP = –40°C to 125°C, VCC= 5 V, unless otherwise specified

Characteristic

Symbol

Test Conditions

Min.

Typ.

Max.

Units

Primary Sampled Current

IP

Transient

0

–

150

A

Continuous

0

–

100

A

Sensitivity2

SensTA

Measured using 25% of full scale IP, TA = 25°C

25.8

26.66

27.53

mV/A

Sens(TOP)HT Measured using 25% of full scale IP, TOP = 25°C to 125°C

25.79

26.66

27.53

mV/A

Sens(TOP)LT Measured using 25% of full scale IP, TOP = –40°C to 25°C

25.66

26.66

27.66

mV/A

Noise4

VNOISEPP

Peak-to-peak, TA= 25°C, 1 nF on VOUT pin to GND

–

24

–

mV

INOISE

Input referred

–

0.4

–

mARMS

/

√(Hz)

Nonlinearity

ELIN

Measured at VOUT around 3.5 V and 4.5 V

–1

–

1

%

Electrical Offset Voltage5,6

VOE(TA)

IP = 0 A, TA = 25°C

–10

±3

10

mV

VOE(TOP)HT IP = 0 A, TOP = 25°C to 125°C

–10

±5

10

mV

VOE(TOP)LT

IP = 0 A, TOP = –40°C to 25°C

–20

±10

20

mV

Electric Offset Voltage Over

Lifetime3

ΔVOE(LIFE)

TOP = –40°C to 125°C, estimated shift after AEC-Q100 grade 0

qualification testing

–

±1

–

mV

Total Output Error

ETOT(HT)

Measured using 25% of full scale IP, TOP = 25°C to 125°C

–3.25

±0.8

3.25

%

ETOT(LT)

Measured using 25% of full scale IP, TOP = –40°C to 25°C

–3.75

±1.5

3.75

%

Total Output Error Including

Lifetime Drift7

ETOT(HT,LIFE) Measured using 25% of full scale IP, TOP = 25°C to 125°C

–4.1

±2.28

4.1

%

ETOT(LT,LIFE) Measured using 25% of full scale IP, TOP = –40°C to 25°C

–5.6

±2.98

5.6

%

1

See Characteristic Performance Data page for parameter distributions over temperature range.

2

This parameter may drift a maximum of ΔSensLIFE over lifetime.

3

Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot

be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information.

4

±3 sigma noise voltage.

5

Drift is referred to ideal VOUT(QU) = 0.5 V.

6

This parameter may drift a maximum of ΔVOE(LIFE) over lifetime.

7

The maximum drift of any single device during qualification testing was 4%.

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