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ADC08D1000 Datasheet(PDF) 11 Page - National Semiconductor (TI) |
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ADC08D1000 Datasheet(HTML) 11 Page - National Semiconductor (TI) |
11 / 31 page Converter Electrical Characteristics (Continued) [Note: This product is currently in development. As such, the parameters specified in this section are DESIGN TAR- GETS. The specifications in this section cannot be guaranteed until device characterization has taken place.] The following specifications apply after calibration for V A =VDR = +1.9VDC, OutV = 1.9V, VIN FSR (a.c. coupled) = differential 800mV P-P,CL = 10 pF, Differential, a.c. coupled Sinewave Input Clock, fCLK = 1 GHz at 0.5VP-P with 50% duty cycle, Non- Extended Control Mode, R EXT = 3300 Ω ±0.1%, Analog Signal Source Impedance = 100Ω. Boldface limits apply for T A = T MIN to TMAX. All other limits TA = 25˚C, unless otherwise noted. (Notes 6, 7) Symbol Parameter Conditions Typical (Note 8) Limits (Note 8) Units (Limits) AC ELECTRICAL CHARACTERISTICS Pipeline Delay (Latency) (Note 11) DI Outputs 13 Input Clock Cycles DId Outputs 14 DQ Outputs Normal Mode 13 Extended Control Mode 13.5 DQd Outputs Normal Mode 14 Extended Control Mode 14.5 Over Range Recovery Time Differential V IN step from ±1.2V to 0V to get accurate conversion TBD ns t WU PD low to Rated Accuracy Conversion (Wake-Up Time) 500 ns f SCLK Maximum Serial Clock Frequency 100 MHz t SSU Data to Serial Clock Setup Time (Note 12) 2.5 TBD ns (min) t SH Data to Serial Clock Hold Time (Note 12) 1 TBD ns (min) Serial Clock Low Time 4 ns (min) Serial Clock High Time 4 ns (min) t CAL Calibration Cycle Time 1.4 x 10 5 Clock Cycles Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. There is no guarantee of operation at the Absolute Maximum Ratings. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Note 2: All voltages are measured with respect to GND = DR GND = 0V, unless otherwise specified. Note 3: When the input voltage at any pin exceeds the power supply limits (that is, less than GND or greater than VA), the current at that pin should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 25 mA to two. This limit is not placed upon the power, ground and digital output pins. Note 4: Human body model is 100 pF capacitor discharged through a 1.5 k Ω resistor. Machine model is 220 pF discharged through ZERO Ohms. Note 5: See AN-450, “Surface Mounting Methods and Their Effect on Product Reliability”. Note 6: The analog inputs are protected as shown below. Input voltage magnitudes beyond the Absolute Maximum Ratings may damage this device. 20097404 Note 7: To guarantee accuracy, it is required that VA and VDR be well bypassed. Each supply pin must be decoupled with separate bypass capacitors. Additionally, achieving rated performance requires that the backside exposed pad be well grounded. Note 8: Typical figures are at TJ = 25˚C, and represent most likely parametric norms. Test limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 9: Calculation of Full-Scale Error for this device assumes that the actual reference voltage is exactly its nominal value. Full-Scale Error for this device, therefore, is a combination of Full-Scale Error and Reference Voltage Error. See Figure 2. For relationship between Gain Error and Full-Scale Error, see Specification Definitions for Gain Error. Note 10: The analog and clock input capacitances are die capacitances only. Additional package capacitances of 0.65 pF differential and 0.95 pF each pin to ground are isolated from the die capacitances by lead and bond wire inductances. Note 11: This parameter is guaranteed by design and is not tested in production. www.national.com 11 |
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