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LM3420M5-8.4 Datasheet(PDF) 11 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No. de Pieza. LM3420M5-8.4
Descripción  Lithium-Ion Battery Charge Controller
Descarga  17 Pages
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Fabricante  NSC [National Semiconductor (TI)]
Página de inicio  http://www.national.com
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LM3420M5-8.4 Datasheet(HTML) 11 Page - National Semiconductor (TI)

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Compensation (Continued)
portant when analyzing closed loop stability. The minimum
and maximum room temperature values of this resistor are
specified in the Electrical Characteristics section of this data
sheet, and a curve showing the temperature coefficient is
shown in the curves section. Minimum values of R
f result in
lower phase margins.
Test Circuit
The test circuit shown in
Figure 2 can be used to measure
and verify various LM3420 parameters. Test conditions are
set by forcing the appropriate voltage at the V
OUT Set test
point and selecting the appropriate R
L or IOUT as specified in
the Electrical Characteristics section. Use a DVM at the
“measure” test points to read the data.
V
REG External Voltage Trim
The regulation voltage (V
REG) of the LM3420 can be exter-
nally trimmed by adding a single resistor from the COMP pin
to the +IN pin or from the COMP pin to the GND pin, depend-
ing on the desired trim direction. Trim adjustments up to
±10% of V
REG can be realized, with only a small increase in
the temperature coefficient. (See temperature coefficient
curve shown in
Figure 3 below.)
Formulas for selecting trim resistor values are shown below,
based on the percent of increase (%incr) or percent of de-
crease (%decr) of the output voltage from the nominal volt-
age.
For LM3420-4.2
R
increase = 22x10
5/%incr
R
decrease = (53x10
5/%decr) − 75x103
For LM3420-8.2
DS012359-7
FIGURE 2. LM3420 Test Circuit
DS012359-8
Normalized Temperature Drift with
Output Externally Trimmed
DS012359-9
Increasing V
REG
DS012359-10
Decreasing V
REG
FIGURE 4. Changing V
REG
www.national.com
11


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