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ADA4817-2ACPZ-R7 Datasheet(PDF) 5 Page - Analog Devices

No. de pieza ADA4817-2ACPZ-R7
Descripción Electrónicos  Low Noise, 1 GHz FastFET Op Amps
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Fabricante Electrónico  AD [Analog Devices]
Página de inicio  http://www.analog.com
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ADA4817-2ACPZ-R7 Datasheet(HTML) 5 Page - Analog Devices

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Data Sheet
ADA4817-1/ADA4817-2
Rev. C | Page 5 of 25
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Rating
Supply Voltage
10.6 V
Power Dissipation
See Figure 4
Common-Mode Input Voltage Range
−VS − 0.5 V to +VS + 0.5 V
Differential Input Voltage
±VS
Storage Temperature Range
−65°C to +125°C
Operating Temperature Range
−40°C to +105°C
Lead Temperature (Soldering, 10 sec)
300°C
Junction Temperature
150°C
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, θJA is specified
for a device soldered in the circuit board for the surface-mount
packages.
Table 4.
Package Type
θJA
θJC
Unit
8-Lead LFCSP (ADA4817-1)
94
29
°C/W
8-Lead SOIC (ADA4817-1)
79
29
°C/W
16-Lead LFCSP (ADA4817-2)
64
14
°C/W
MAXIMUM SAFE POWER DISSIPATION
The maximum safe power dissipation for the ADA4817-1/
ADA4817-2 is limited by the associated rise in junction
temperature (TJ) on the die. At approximately 150°C (which is
the glass transition temperature), the properties of the plastic
change. Even temporarily exceeding this temperature limit may
change the stresses that the package exerts on the die, permanently
shifting the parametric performance of the ADA4817-1/
ADA4817-2. Exceeding a junction temperature of 175C for an
extended period can result in changes in silicon devices,
potentially causing degradation or loss of functionality.
The power dissipated in the package (PD) is the sum of the
quiescent power dissipation and the power dissipated in the
die due to the ADA4817-1/ADA4817-2 drive at the output.
The quiescent power is the voltage between the supply pins
(VS) multiplied by the quiescent current (IS).
PD = Quiescent Power + (Total Drive Power – Load Power)
(1)

L
OUT
L
OUT
S
S
S
D
R
V
R
V
V
I
V
P
2
2


(2)
Consider rms output voltages. If RL is referenced to −VS, as in
single-supply operation, the total drive power is VS × IOUT. If the
rms signal levels are indeterminate, consider the worst-case
scenario, when VOUT = VS/4 for RL to midsupply.
 
L
S
S
S
D
R
V
I
V
P
2
4
/
(3)
In single-supply operation with RL referenced to −VS, the worst-
case situation is VOUT = VS/2.
Airflow increases heat dissipation, effectively reducing θJA. More
metal directly in contact with the package leads and exposed
paddle from metal traces, throughholes, ground, and power
planes also reduces θJA.
Figure 4 shows the maximum safe power dissipation in the
package vs. the ambient temperature for the exposed paddle
8-lead LFCSP (single 94°C/W), 8-lead SOIC (single 79°C/W)
and 16-lead LFCSP (dual 64°C/W) packages on JEDEC
standard 4-layer boards. θJA values are approximations.
3.5
0
–40
AMBIENT TEMPERATURE (°C)
3.0
2.5
2.0
1.5
1.0
0.5
–30 –20 –10 0
10 20 30 40 50 60 70 80 90 100
ADA4817-1, LFCSP
ADA4817-2, LFCSP
ADA4817-1, SOIC
Figure 4. Maximum Safe Power Dissipation vs. Ambient Temperature for
a 4-Layer Board
ESD CAUTION


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