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ADS8411IBPFBT Datasheet(PDF) 1 Page - Burr-Brown (TI) |
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ADS8411IBPFBT Datasheet(HTML) 1 Page - Burr-Brown (TI) |
1 / 23 page BurrBrown Products from Texas Instruments FEATURES APPLICATIONS DESCRIPTION CDAC _ + Output Latches and 3-State Drivers BYTE 16-/8-Bit Parallel DATA Output Bus SAR Conversion and Control Logic Comparator Clock +IN −IN REFIN CONVST BUSY CS RD RESET 4.096-V Internal Reference REFOUT ADS8411 SLAS369B – APRIL 2002 – REVISED DECEMBER 2004 16-BIT, 2 MSPS, UNIPOLAR INPUT, MICRO POWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE • DWDM • 2-MHz Sample Rate • Instrumentation • 16-Bit NMC Ensured Over Temperature • High-Speed, High-Resolution, Zero Latency • Zero Latency Data Acquisition Systems • Unipolar Single-Ended Input Range: • Transducer Interface 0 V to Vref • Medical Instruments • Onboard Reference • Communication • Onboard Reference Buffer • High-Speed Parallel Interface • Power Dissipation: 175 mW at 2 MHz Typ The ADS8411 is a 16-bit, 2 MHz A/D converter with • Wide Digital Supply an internal 4.096-V reference. The device includes a 16-bit capacitor-based SAR A/D converter with in- • 8-/16-Bit Bus Transfer herent sample and hold. The ADS8411 offers a full • 48-Pin TQFP Package 16-bit interface and an 8-bit option where data is read • ESD Sensitive – HBM Capability of 500 V, using two 8-bit read cycles. 1000 V at All Input Pins The ADS8411 has a unipolar single-ended input. It is available in a 48-lead TQFP package and is characterized over the industrial -40 °C to 85°C tem- perature range. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2002–2004, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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