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Si4461-Bxx-FM Datasheet(PDF) 10 Page - Silicon Laboratories |
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Si4461-Bxx-FM Datasheet(HTML) 10 Page - Silicon Laboratories |
10 / 56 page Si4464/63/61/60 10 Rev 1.2 Modulation Deviation Resolution2,5 FRES-960 850–1050 MHz — 28.6 —Hz FRES-525 420–525 MHz — 14.3 —Hz FRES-350 283–350 MHz — 9.5 —Hz FRES-175 142–175 MHz — 4.7 —Hz Modulation Deviation Resolution (Si4464)3 FRES-960 705–960 MHz —28.6 — Hz FRES-639 470–639 MHz —19.1 — Hz FRES-479 353–479 MHz —14.3 — Hz FRES-319 235–319 MHz —9.5 — Hz FRES-239 177–239 MHz —7.1 — Hz FRES-159 119–159 MHz —4.7 — Hz Output Power Range (Si4464/63)6 PTX –20 — +20 dBm Output Power Range (Si4461)6 PTX61 –40 — +16 dBm Output Power Range (Si4460)6 PTX60 –40 — +13 dBm TX RF Output Steps3 PRF_OUT Using switched current match within 6 dB of max power —0.1 — dB TX RF Output Level3 Variation vs. Temperature PRF_TEMP –40 to +85 C— 1 — dB TX RF Output Level Variation vs. Frequency3 PRF_FREQ Measured across 902–928 MHz — 0.5 — dB Transmit Modulation Filtering3 B*T Gaussian Filtering Bandwith Time Product —0.5 — Table 4. Transmitter AC Electrical Characteristics1 (Continued) Parameter Symbol Test Condition Min Typ Max Unit Notes: 1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 14. 2. For applications that use the major bands covered by Si4463/61/60, customers should use those parts instead of Si4464. 3. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1. Definition of Test Conditions" on page 14. 4. The maximum data rate is dependant on the XTAL frequency and is calculated as per the formula: Maximum Symbol Rate = Fxtal/60, where Fxtal is the XTAL frequency (typically 30 MHz). 5. Default API setting for modulation deviation resolution is double the typical value specified. 6. Output power is dependent on matching components and board layout. |
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