9

Electrical Specifications

Test conditions that are not specified can be anywhere within the recommended operating range.

All typical specifications are at T

Parameter

Symbol

Min.

Typ.

Max.

Units

Test Conditions

Quiescent Supply Current 1

mA

HCPL-9000/-0900

0.012

0.018

HCPL-9030/-0930

0.012

0.018

HCPL-9031/-0931

2.5

3.0

HCPL-900J/-090J

0.024

0.036

HCPL-901J/-091J

5.0

6.0

HCPL-902J/-092J

2.5

3.0

Quiescent Supply Current 2

I

DD2

mA

V

HCPL-9000/-0900

5.0

6.0

HCPL-9030/-0930

5.0

6.0

HCPL-9031/-0931

2.5

3.0

HCPL-900J/-090J

8.0

12.0

HCPL-901J/-091J

5.0

6.0

HCPL-902J/-092J

6.0

9.0

Logic Input Current

-10

10

µA

Logic High Output Voltage

V

OH

V

V

DD2

VI

V

V

I

Logic Low Output Voltage

0

0.1

V

0.5

0.8

V

Switching Specifications

Maximum Data Rate

100

110

MBd

C

Clock Frequency

fmax

50

MHz

Propagation Delay Time to Logic

10

15

ns

Low Output

Propagation Delay Time to Logic

10

15

ns

High Output

Pulse Width

10

ns

|PWD|

2

3

ns

|t

46

ns

Output Rise Time (10 – 90%)

13

ns

Output Fall Time (10 – 90%)

13

ns

Propagation Delay Enable to Output (Single Channel)

High to High Impedance

35

ns

Low to High Impedance

t

PLZ

35

ns

High Impedance to High

t

PZH

35

ns

High Impedance to Low

35

ns

Channel-to-Channel Skew

23

ns

(Dual and Quad Channels)

Common Mode Transient Immunity

15

18

kV/

µsV

|CM

Notes:

1. PWD is defined as |t

input voltage that can be sustained while maintaining V

voltage edges.

This product has been tested for electrostatic sensitivity to the limits stated in the specifications. However, Agilent recommends that all integrated circuits

be handled with appropriate care to avoid damage. Damage caused by inappropriate handling or storage could range from performance degradation to

complete failure.