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AD9681-125EBZ Datasheet(PDF) 8 Page - Analog Devices |
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AD9681-125EBZ Datasheet(HTML) 8 Page - Analog Devices |
8 / 41 page Data Sheet AD9681 Rev. C | Page 7 of 40 SWITCHING SPECIFICATIONS AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted. Table 4. Parameter 1, 2 Symbol Temp Min Typ Max Unit CLOCK3 Input Clock Rate Full 10 1000 MHz Conversion Rate4 Full 10 125 MSPS Clock Pulse Width High tEH Full 4.00 ns Clock Pulse Width Low tEL Full 4.00 ns OUTPUT PARAMETERS3 Propagation Delay tPD Full 1.5 2.3 3.1 ns Rise Time (20% to 80%) tR Full 300 ps Fall Time (20% to 80%) tF Full 300 ps FCO±1, FCO±2 Propagation Delay tFCO Full 1.5 2.3 3.1 ns DCO±1, DCO±2 Propagation Delay5 tCPD Full tFCO + (tSAMPLE/16) ns DCO±1, DCO±2 to Data Delay5 tDATA Full (tSAMPLE/16) − 300 (tSAMPLE/16) (tSAMPLE/16) + 300 ps DCO±1, DCO±2 to FCO±1, FCO±2 Delay5 tFRAME Full (tSAMPLE/16) − 300 (tSAMPLE/16) (tSAMPLE/16) + 300 ps Lane Delay tLD 90 ps Data to Data Skew tDATA-MAX − tDATA-MIN Full ±50 ±200 ps Wake-Up Time (Standby) 25°C 250 ns Wake-Up Time (Power-Down)6 25°C 375 μs Pipeline Latency Full 16 Clock cycles APERTURE Aperture Delay tA 25°C 1 ns Aperture Uncertainty (Jitter) tJ 25°C 135 fs rms Out-of-Range Recovery Time 25°C 1 Clock cycles 1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed. 2 Measured on standard FR-4 material. 3 Adjustable using the SPI. The conversion rate is the clock rate after the divider. 4 The maximum conversion rate is based on two-lane output mode. See the Digital Outputs and Timing section for the maximum conversion rate in one-lane output mode. 5 tSAMPLE/16 is based on the number of bits in two LVDS data lanes. tSAMPLE = 1/fSAMPLE. 6 Wake-up time is defined as the time required to return to normal operation from power-down mode. |
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