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ADS8598S Datasheet(PDF) 5 Page - Texas Instruments

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No. de pieza ADS8598S
Descripción Electrónicos  18-Bit, 200-kSPS, 8-Channel, Simultaneous-Sampling ADC With Bipolar Inputs on a Single Supply
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Fabricante Electrónico  TI1 [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI1 - Texas Instruments

ADS8598S Datasheet(HTML) 5 Page - Texas Instruments

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ADS8598S
www.ti.com
SBAS827 – SEPTEMBER 2017
Product Folder Links: ADS8598S
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Copyright © 2017, Texas Instruments Incorporated
Pin Functions (continued)
PIN
TYPE
DESCRIPTION
NAME
NO.
RD/SCLK
12
DI
Multi-function logic input pin (see the RD/SCLK (Input) section):
this pin is an active-low ready input pin in parallel and parallel byte interface;
this pin is a clock input pin in serial interface mode.
REFCAPA
44
AO
Reference amplifier output pin. This pin must be shorted to REFCAPB and decoupled to AGND using a
low ESR, 10-µF ceramic capacitor.
REFCAPB
45
AO
Reference amplifier output pin. This pin must be shorted to REFCAPA and decoupled to AGND using a
low ESR, 10-µF ceramic capacitor.
REFGND
43, 46
P
Reference GND pin. This pin must be shorted to the analog GND plane and decoupled with
REFIN/REFOUT on pin 42 using a 10-µF capacitor.
REFIN/REFOUT
42
AIO
This pin acts as an internal reference output when REFSEL is high;
this pin functions as input pin for the external reference when REFSEL is low;
decouple with REFGND on pin 43 using a 10-µF capacitor.
REFSEL
34
DI
Active high logic input to enable the internal reference
(see the REFSEL (Input) section).
REGCAP1
36
AO
Output pin 1 for the internal voltage regulator; decouple separately to AGND using a 1-µF capacitor.
REGCAP2
39
AO
Output pin 2 for the internal voltage regulator; decouple separately to AGND using a 1-µF capacitor.
RESET
11
DI
Active high logic input to reset the device digital logic
(see the RESET (Input) section).
STBY
7
DI
Active low logic input to enter the device into one of the two power-down modes: standby or shutdown
(see the Power-Down Modes section).
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
Transient currents of up to 100 mA do not cause SCR latch-up.
6 Specifications
6.1 Absolute Maximum Ratings
at TA = 25°C (unless otherwise noted)
(1)
MIN
MAX
UNIT
AVDD to AGND
–0.3
7.0
V
DVDD to AGND
–0.3
7.0
V
Analog input voltage to AGND(2)
–15
15
V
Digital input to AGND
–0.3
DVDD + 0.3
V
REFIN to AGND
–0.3
AVDD + 0.3
V
Input current to any pin except supplies(2)
–10
10
mA
Temperature
Operating
–40
125
°C
Junction, TJ
150
Storage, Tstg
–65
150
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings
VALUE
UNIT
V(ESD)
Electrostatic discharge
Human-body model (HBM),
per ANSI/ESDA/JEDEC JS-001(1)
All pins except analog inputs
±2000
V
Analog input pins only
±9000
Charged-device model (CDM),
per JEDEC specification JESD22-C101(2)
±500


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