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ADS5421 Datasheet(PDF) 2 Page - Burr-Brown (TI)

[Old version datasheet] Texas Instruments acquired Burr-Brown Corporation. Click here to check the latest version.
No. de pieza ADS5421
Descripción Electrónicos  14-Bit, 40MHz Sampling ANALOG-TO-DIGITAL CONVERTER
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Fabricante Electrónico  BURR-BROWN [Burr-Brown (TI)]
Página de inicio  http://www.burr-brown.com
Logo BURR-BROWN - Burr-Brown (TI)

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ADS5421
2
SBAS237D
www.ti.com
ELECTRICAL CHARACTERISTICS
TA = specified temperature range, typical at +25°C, +VSA = +VSD = +5V, differential input range = 1.5V to 3.5V each input (4Vp-p), sampling rate = 40MHz, internal
reference, VDRV = +3V, and –1dBFS, unless otherwise noted.
ADS5421Y
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
RESOLUTION
14 Tested
Bits
SPECIFIED TEMPERATURE RANGE
Ambient Air
–40 to +85
°C
ANALOG INPUT
Standard Differential Input Range
Full-Scale = 4Vp-p
1.5
3.5
V
Common-Mode Voltage
2.5
V
Optional Input Ranges
Selectable
2Vp-p or 3Vp-p
V
Analog Input Bias Current
1
µA
Analog Input Bandwidth
500
MHz
Input Capacitance
9pF
CONVERSION CHARACTERISTICS
Sample Rate
1M
40M
Samples/sec
Data Latency
10
Clk Cyc
DYNAMIC CHARACTERISTICS
Differential Linearity Error (largest code error)
f = 1MHz
±0.5
LSB
f = 10MHz
±0.5
±1.0
LSB
No Missing Codes
Tested
Integral Nonlinearity Error, f = 1MHz
±2.5
LSB
Spurious-Free Dynamic Range(1)
f = 1MHz
88
dBFS(2)
f = 10MHz
78
85
dBFS
f = 30MHz
82
dBFS
2-Tone Intermodulation Distortion(3)
f = 14.5MHz and 15.5MHz (–7dB each tone)
–90
dBc
Signal-to-Noise Ratio (SNR)
f = 1MHz
76
dBFS
f = 10MHz
72
75
dBFS
f = 30MHz
75
dBFS
Signal-to-(Noise + Distortion) (SINAD)
f = 1MHz
75
dB
f = 10MHz
72
74
dB
f = 30MHz
74
dBFS
Effective Number of Bits(4)
f = 1MHz
12.2
Bits
Output Noise
IN and IN tied to CM
0.4
LSB rms
Aperture Delay Time
3ns
Aperture Jitter
1
ps rms
Over-Voltage Recovery Time
5ns
Full-Scale Step Acquisition Time
5ns
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
+VSA, +VSD, VDRV ............................................................................... +6V
Analog Input .......................................................... (–0.3V) to (+VS + 0.3V)
Logic Input ............................................................ (–0.3V) to (+VS + 0.3V)
Case Temperature ......................................................................... +100
°C
Junction Temperature .................................................................... +150
°C
Storage Temperature ..................................................................... +150
°C
NOTE: (1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional operation of the
device at these or any other conditions beyond those specified is not implied.
ABSOLUTE MAXIMUM RATINGS(1)
SPECIFIED
PACKAGE
TEMPERATURE
PACKAGE
ORDERING
TRANSPORT
PRODUCT
PACKAGE-LEAD
DESIGNATOR
RANGE
MARKING
NUMBER
MEDIA, QUANTITY
ADS5421Y
LQFP-64
PM
–40
°C to +85°C
ADS5421Y
ADS5421Y/T
Tape and Reel, 250
"
"""
"
ADS5421Y/R
Tape and Reel, 1500
PACKAGE/ORDERING INFORMATION(1)
NOTE: (1) For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet.
PRODUCT
DESCRIPTION
USER’S GUIDE
ADS5421EVM
Populated Evaluation Board
SBAU084
EVALUATION BOARD


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